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A5-DSIO option

The DSIO option adds a multi-channel digital serial interface to the audio analyzer, providing direct connection for chip level interfaces and playing a decisive role in the design and development of circuit boards. It is easy to use, accurate test results, and can be widely used for audio quality testing of various digital devices.
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    • Commodity name: A5-DSIO option
    • Commodity ID: A5-DSIO

    The DSIO option adds a multi-channel digital serial interface to the audio analyzer, providing direct connection for chip level interfaces and playing a decisive role in the design and development of circuit boards. It is easy to use, accurate test results, and can be widely used for audio quality testing of various digital devices.

    The DSIO option adds a multi-channel digital serial interface to the audio analyzer, providing direct connection for chip level interfaces and playing a decisive role in the design and development of circuit boards. It is easy to use, accurate test results, and can be widely used for audio quality testing of various digital devices.

    Key words:
    • ax-dsio
    • 时钟
    • 通道
    • 接口
    • 数据
    • 发射器
    • 信号
    • 连接
    • 接收器
    • 可以
  •    • Hardware interface: HD-15 connector

    • Number of channels: 1, 2, 4, 6, 8

    • Format: I2S, DSP, left-aligned, right-aligned

    • Pulse voltage: 1.8V, 2.5V, 3.3V

    • Data length: 8-32 bits

    • Word length: 8-128 bits

    • Sample rate: 4KHz-216KHz

    • Master clock rate: 4KHz-56MHz

    • Master clock source: transmitter (external or internal), receiver (external or internal)

    • Master clock: reversible

    • Bit/clock direction: transmitter (IN or OUT), receiver (IN or OUT)

    • Bit clock edge synchronization: rising or falling

    • Jitter: Select ON or OFF

    • Multi-channel configuration: TDM (1/2/4/6/8 channels), multiple data connections (1/2/4/6/8 channels)

    • With a simple and flexible configuration interface, allowing saving or loading test configurations, convenient for users to test, greatly improving test efficiency.

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